MRS Electronic offers a variety of different test systems. The services include the individual development as well as the commissioning of the finished plants at the customer's, and worldwide. In the tester segment, MRS offers, among others, the following test methods:
Because all modules of MRS-Test systems are modular MRS can build customized systems
Since years MRS works together with mechanical suppliers for building customer specific handling and contacting systems
Measure all parameters of the IGBT’s on the module (up to 900A)
Full integration in an full automatic handling system
RBSOA / SCSOA Testing
Depending on the quality standards during the production of different IGBT and MOSFET module types a RBSOA and SCSOA test is performed. The range of systems last from stand-alone laboratory systems with manual feeding to valuate DUTs during the developing process to full automated shift operation production lines. For RBSOA and SCSOA tests it is essential that the DUT undergoes a real stress test during switching and not just turning on and off the DUT.
To reach a real stress test several criteria must be fulfilled like
Current Cycling tests up to 300 A
The DUT’s are mounted on water-cooled heatsinks. The DUT is powered with high current pulses up to a specified temperature. Is this temperature reached, the switchfield select the next DUT and heat it up. After one cycle the temperature of the first DUT is measured and if the temperature is still too high, the DUT will be skipped. The Chiller and the heatsinks are chosen that after one cycle the first part is nearly back on his start-temperature and can be remeasured.
For a continuous quality control during the production of different electronic semiconductors thermal cycling tests are performed.
During this test electronic semiconductors are heated up due current pulses with a given frequency. In this example 16 rectifier diodes are pulsed with a current up to 200 A at the same time.
The forward voltage is measured continuously until the voltage drops below a given value which stands for the temperature inside the rectifier diode. Afterwards the rectifier diode is cooled down to a given forward voltage start value and repeats the test. This long time tests are running more than 500hours which makes a very stable system essential.
In this example there are 16 unique test positions which can run independent.